Update202501

 January 2025 Update

The IQR-Based Data Cleaning option has been transformed into the IQR-based data correction option 

The transformation of the IQR-Based Data Cleaning option, which was implemented in November 2024, into the IQR-based data correction option, along with improvements to the correction algorithm, has enhanced the efficiency of using automated BSEF analysis data to create an attribute section.   

As a result of this transformation, the IQR-Based Data Cleaning settings panel has been removed from the left tab group, and the settings for interquartile range data correction have been consolidated into the IQR-based data correction parameter group. This group is now located on the Primary Attribute panel and on the settings panel for sections of other attributes:  

Thus, for the primary attribute, which is the real part of the complex relative permittivity, and for other attributes, it is now possible to individually configure the use of this option and define correction settings.  

When the checkbox in the IQR-based data correction parameter group is selected, the georadar profile signals are analyzed during section creation. Based on this analysis, the section is divided into a specified number of clusters. For each cluster, attribute range boundaries are calculated using the formula [Q1 - K* IQR,   Q3 + K * IQR], where Q1 is the first quartile, Q3 is the third quartile, IQR is the interquartile range calculated as IQR=Q3−Q1, and K is the scaling coefficient for the interquartile range. The attribute values within each cluster are then recalculated according to the calculated range boundaries.   

The Q-factor attribute section created without using IQR correction is shown below, visualization of the section in the overlay mode on the GPR profile.  The section consists of two main layers with significantly different electrophysical properties. Due to these differences, the boundary between these layers is clearly visible on the GPR profile. The section reveals high attribute values from the upper layer penetrating into the lower layer, which is characterized by lower Q-factor values. This phenomenon occurs due to signal over-reflections from dielectric-contrast objects in the upper layer into the lower layer.

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